JMAR's products add the capability of atomic force microscopy (AFM) to our inspection metrology platforms. JMAR's resolves, literally, sub-nanometer details. The facilitates both optical inspection and atomic force inspection in one tool, and the AFM is par-centered to the visible lenses. The is also capable of magnetic force microscopy (MFM), and electric force microscopy (EFM). No defect is too small for detection by JMAR's .